Search
Language  English |  中文 |  Español |  عربى |  Türkçe |
Semiconductor Products

SiC Ingot Laser slicing Equipment RM-LS-SiC-1200

 
By utilizing semi-transparent band lasers to precisely focus on the interior of the ingot, a uniform modification layer is formed through the multi-photon effect, inducing controllable micro-crack propagation. This is followed by an ultrasonic-assisted lift-off process to achieve the complete lift-off of the full substrate. The equipment can efficiently complete SiC ingot lift-off and wafer precision thinning, while being compatible with the lift-off of hard and brittle crystal materials such as GaN and diamond. It features ultra-low lift-off loss, high flatness, no mechanical stress, and high mass production efficiency, making it a core mass production equipment for wide bandgap semiconductor power devices.
SiC Ingot Laser slicing Equipment RM-LS-SiC-1200
  • Complete Set of Equipment

  • Self-developed Core Module

    Customized light field control algorithm

  • High Efficiency, Low Loss

Advanced SiC equipment driven by customized light field control algorithms.
  • Suitable for 8/12 inch

  • Self-developed Core Module
    Core algorithms and structures for focus tracking, light field control, and guided wafer pickup.
  • Low material loss
    Total loss after grinding as low as 100um (8-inch conductive).
  • High processing efficiency
    High processing efficiency: 15 min/wafer.
  • Integrated solution
    Solution integrating laser modification + ultrasonic-assisted separation + auto wafer pickup + AOI.